Impurity diffusion through strained semiconductors
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: The Quarterly Journal of Mechanics and Applied Mathematics
سال: 2005
ISSN: 0033-5614,1464-3855
DOI: 10.1093/qjmam/hbi025